Studies of the chemical and phase composition of solids by X-ray fluorescent spectroscopy
Studies of the chemical composition of solids such as metals, metal alloys, semiconductors, ceramics, soil, rocks, salts, chemical and phased (mineralogical) composition by X-ray fluorescent WD-XRF and EDX spectroscopy methods
Studies of the chemical and phase composition of solids by X-ray diffraction (XRD) methods
Studies of the chemical and phase composition of solids such as metals, metal alloys, semiconductors, ceramics, soil, rocks, salts by X-ray diffraction (XRD) methods.
The chemical composition of metal or ceramic products of small dimensions, complex configuration
The EDX test is performed under a scanning electron microscope, Helios Nanolab 650 (FEI Company) and EVO-50 (Carl Zeiss).
Chemical composition and state of chemical elements of thin (10-40 nm) surface layers and their distribution by depth
The X-ray photoelectron spectroscopy (XPS) method is studied using the Spectrometer Axis Supra+ (Kratos Analytical).
Images of the surface and transverse sections of solids
Incisions are prepared using a beam of focused gallium ions (FIB). Images are obtained under an electron microscope Helios Nanolab 650 (FEI Company). Microscope resolution up to 0.9 nm.
Studies on the intrinsic structure of solids
Study of the shape, chemical composition and crystalline structure of particles of nano and micron sizes with the translucent electron microscope Tecnai G2 F20 X-TWIN (FEI Company). Microscope resolution up to 0.1 nm.
Irina Fiodorova
El. paštas: irina.fiodorova@ftmc.lt
Tel. nr.: +37063376518